3.3.2.10. NXrefscanΒΆ

Status:

application definition, extends NXobject, version 1.0b

Description:

This is an application definition for a monochromatic scanning reflectometer.

It does not have the information to calculate the resolution since it does not have any apertures.

Symbols:

No symbol table
Groups cited:
NXdata, NXdetector, NXentry, NXinstrument, NXmonitor, NXmonochromator, NXsample, NXsource

Structure:

entry: NXentry

title: NX_CHAR

start_time: NX_DATE_TIME

end_time: NX_DATE_TIME

definition: NX_CHAR

Official NeXus NXDL schema to which this file conforms

Obligatory value: NXrefscan

instrument: NXinstrument

(source): NXsource

type: NX_CHAR

name: NX_CHAR

probe: NX_CHAR

Any of these values: neutron | x-ray | electron

monochromator: NXmonochromator

wavelength: NX_FLOAT {units=NX_WAVELENGTH}

(detector): NXdetector

data[NP]: NX_INT

polar_angle[NP]: NX_FLOAT {units=NX_ANGLE}

sample: NXsample

name: NX_CHAR

Descriptive name of sample

rotation_angle[NP]: NX_FLOAT {units=NX_ANGLE}

control: NXmonitor

mode: NX_CHAR

Count to a preset value based on either clock time (timer) or received monitor counts (monitor).

Any of these values: monitor | timer

preset: NX_FLOAT

preset value for time or monitor

data[NP]: NX_FLOAT {units=NX_ANY}

Monitor counts for each step

data: NXdata

data –> /NXentry/NXinstrument/NXdetector/data

rotation_angle –> /NXentry/NXsample/rotation_angle

polar_angle –> /NXentry/NXinstrument/NXdetector/polar_angle

NXDL Source:
https://github.com/nexusformat/definitions/blob/master/applications/NXrefscan.nxdl.xml